An Experiment on Discharge Time Lag Affected by Humidity and Rough Surface in a PMMA Closed Void

Nawawi, Zainuddin and Ahnad , Husein and Kurnianto, Rudy and Hozumi, N and Nagao, M (2010) An Experiment on Discharge Time Lag Affected by Humidity and Rough Surface in a PMMA Closed Void. In: 15th Asian Conference on Electrical Discharge. Xi’an Jiaotong University, China, Xi'an, China, A1-A81. ISBN 978-7-900780-15-7 7-10

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    Abstract

    The discharge time lag due to deteriorations of high humidity and rough dielectric surface in insulation-gap-metal system has been studied using CIGRE Method II (CM II) electrode. The sample was polymethylmethacrylate (PMMA). The residual probability of time lag was becoming shorter as the relative humidity (RH) rises. It is considered due to the electrons detached from water molecule. The characteristics time lag at 36.8 % of residual probability made the positive polarity shorter than the negative. Time lag with positive polarity was more sensitive to the applied voltage than the negative one. A rough surface brought by plasma exposure would enhance electrical field so that the discharge would be easier to take place with shorter time lag. Decrease in discharge time lag would make possible for partial discharge (PD) occurred with large number of small discharges. After 20 and 60 minutes of recovery times, the time lag of 16 and 21 seconds of exposure levels were not change significantly. However, at 3 seconds of exposure level, 60 minutes of recovery time was long enough to shift the curve to the longer time lag compares to that of 20 minutes. It seems that the treatment changes the surface properties of material only, not the bulk properties. Index Terms—CM II, cumulative and residual probabilities, partial discharge, plasma, PMMA, relative humidity

    Item Type: Book Section
    Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
    Divisions: Faculty of Engineering > Department of Electrical Engineering
    Depositing User: Zainuddin Nawawi
    Date Deposited: 17 Jun 2013 11:58
    Last Modified: 17 Jun 2013 11:58
    URI: http://eprints.unsri.ac.id/id/eprint/2335

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